The Ambient Pressure Surface Characterization Laboratory (APSCL) has unique capabilities for preparation and characterization of samples in a range of environments. The capabilities are housed in Johnson Hall and Gilbert Hall and includes microscopy, spectroscopy, and diffraction. Users can be trained to use the equipment for independent research projects or staff members can assist or perform the analysis for you. The APSCL has two main instruments which can be used for a range of surface characterization measurements. The primary capabilities are X-ray photoelectron spectroscopy (XPS) and scanning tunneling microscopy (STM).

Ambient-Pressure XPS/STM

AP-XPS system

PHI 5600

PHI 5600 XPS system

When publishing research involving experiments conducted at the APSCL, please include the following text in the acknowledgements: “Part of this research was conducted at the Northwest Nanotechnology Infrastructure, a National Nanotechnology Coordinated Infrastructure site at Oregon State University which is supported in part by the National Science Foundation (grant NNCI-1542101) and Oregon State University.”

If the AP-XPS/AP-STM system was used, please include the following text in the acknowledgments: “Acquisition of the Ambient-Pressure X-ray Photoelectron Spectroscopy/Ambient-Pressure Scanning Tunneling Microscopy system was supported by the National Science Foundation-Major Research Instrumentation program (grant DMR-1429765), the M. J. Murdock Charitable Trust, Oregon BEST, Oregon Nanoscience and Microtechnologies Institute, and Oregon State University.”