The Ambient Pressure Surface Characterization Laboratory (APSCL) - offers unique capabilities for sample preparation and characterization in a range of environments.

  • Primary capabilities: X-ray photoelectron spectroscopy (XPS), scanning tunneling microscopy (STM), and temperature programmed desorption (TPD).
  • Our ambient pressure laboratory enables ambient pressure XPS (APXPS) and ambient pressure STM (APSTM) up to the Torr regime.
  • Housed in Johnson Hall, users can be trained to use the equipment for independent research projects or staff members can assist or perform analysis for you.

 

SPECS Ambient Pressure XPS/STM

AP-XPS system

 

 

 

Hiden TPD

Hiden TPD

 

 

 

PHI 5600 XPS

Phi 5600 XPS

 

 

When publishing research involving experiments conducted at the APSCL, please include the following text in the acknowledgements: “Part of this research was conducted at the Northwest Nanotechnology Infrastructure, a National Nanotechnology Coordinated Infrastructure site at Oregon State University which is supported in part by the National Science Foundation (grant NNCI-2025489) and Oregon State University.”

If the AP-XPS/AP-STM system was used, please include the following text in the acknowledgments: “Acquisition of the Ambient-Pressure X-ray Photoelectron Spectroscopy/Ambient-Pressure Scanning Tunneling Microscopy system was supported by the National Science Foundation-Major Research Instrumentation program (grant DMR-1429765), the M. J. Murdock Charitable Trust, Oregon BEST, Oregon Nanoscience and Microtechnologies Institute, and Oregon State University.”